CV

Senior Software Systems Engineer

PDF Solutions

1D Registration Location Discovery – Geometry-based Pattern Search (Mar 2026 – Present)

• Designed a geometry-aware search system to identify robust registration locations from semiconductor layouts using edge-based spatial analysis.
• Built efficient candidate generation and filtering mechanisms with spatial indexing and rule-based isolation constraints for structured layout patterns.
• Developed scoring strategies to evaluate pattern quality and robustness under highly noisy conditions.
• Designed and integrated an end-to-end pipeline from layout parsing to candidate search and result generation, deployed on HPC (SGE clusters) for scalable large-scale layout processing.

Image-based Registration & Template Matching Pipeline (Oct 2025 – Mar 2026)

• Designed an end-to-end image-based pipeline for registration location selection, including layout rasterization, candidate sampling, template matching, and quality scoring.
• Applied computer vision techniques (template matching and correlation analysis) to identify robust patterns under noise, ambiguity, and repetitive structures.
• Developed data-driven quality metrics (e.g., peak ratio, feature coverage) for pattern ranking and selection.
• Built scalable and production-ready workflows, deployed across HPC (SGE) and AWS with debugging and validation pipelines for large-scale semiconductor inspection.

Graduate Research Assistant

Vanderbilt University

Ph.D. research in optoelectronic characterization, signal processing, and data-driven analysis

• Performed optoelectronic characterization using scanning photocurrent microscopy (SPCM), generating spatially-resolved signal maps for device behavior and defect patterns.
• Analyzed photocurrent and electrical signals to characterize carrier transport, device variability, and pattern-level anomalies across spatial regions.
• Developed signal and image processing pipelines (MATLAB/Python) for noise reduction, feature extraction, and spatial pattern recognition.
• Explored data-driven approaches for pattern analysis and feature extraction from high-dimensional measurement data.

Ph.D.

Vanderbilt University

Electrical Engineering and Computer Science

B.Sc.

Huazhong University of Science and Technology

Materials Forming and Control Engineering

Hamilton Fellowship

Vanderbilt University

Fellowship awarded to support doctoral studies.